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Polarizing microscope heating and cooling stage

This is an ultra-thin heating and cooling stage, which is widely applied in the research fields of geological inclusions, organic inclusions, biomedicine, etc. It features a wide temperature range and high precision, capable of meeting the temperature-varying requirements of most experiments. Moreover, its sample area is movable along the X and Y axes, which greatly facilitates the observation of sample movement under the microscope.

SEM-In-Situ Tensile Testing Thermal Stage

The SEM In-Situ Tensile Testing Thermal Stage is used for high and low temperature microscopic observation of materials under tensile or compressive conditions. It can be used in conjunction with scanning electron microscopes (SEMs), and is mainly applied in research fields such as organic polymers, nanomaterials, metal materials, and composite materials. This equipment is an important tool for studying the mechanical properties of new materials.

SEM Heating and Cooling Stage

This is a heating and cooling stage used in combination with a scanning electron microscope (SEM). While observing the sample's morphology, it analyzes information such as the sample's composition and crystal structure under different temperatures, thereby enabling a more comprehensive study of the material's properties and behaviors.

Cryogenic Optical Station

This is a compression refrigeration optical station independently developed by Congtical, with an operating temperature range covering 6K to 330K. Specifically designed for optical and electrical experiments under extreme low-temperature environments, the device can be applied in research fields such as low-temperature Raman, quantum optics, semiconductor industry, MEMS, superconductivity, electronics, physics, and materials science. The system adopts compression refrigeration technology, requiring no liquid helium and with vibration below 100nm. It is equipped with an automatic temperature control module to realize one-click temperature change operation. It is compatible with microscopy, spectral measurement, and scanning probe technology, and can be integrated with optional components such as low-temperature piezoelectric displacement stages, optical fiber assemblies, and electrical connectors. The device has been deployed in the Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences, and the Chongqing Institute of Materials.

Multi-window spectrophotometer hot and cold stage

This stage has multiple observation windows. It’s liquid nitrogen pipelines, and electrical connection lines are set on the top of the cavity. It suitable for closed optical path testing needs.

High and low temperature probe station with displacement control

High and low temperature probe stations can be divided into two types based on the cooling method: liquid nitrogen cooling and GM refrigerator cooling. The temperature range is controllable from -267℃ to 600℃. The product is compatible with DC signals as low as 1pA, high-frequency signals up to 50GHz, and high-voltage signals up to 1KV.It is widely used in fields such as the semiconductor industry, MEMS, superconductivity, electronics, physics, and materials science, and can perform standard IV, CV, microwave, and optoelectronic experiments.

High-Low Temperature Hall Effect Testing System

The HMS system (available in HMS-200A and HMS-200B models) is a professional testing system mainly used for Hall effect measurement and related parameter analysis of materials. It is widely applicable to research on semiconductor materials, magnetic materials, high-temperature superconducting materials and other functional materials, providing reliable data support for material performance research in fields such as semiconductor wafer processing, solar cells and magnetic storage.

High-Low Temperature Thermoelectric Parameter Testing System

The High-Low Temperature Thermoelectric Parameter Testing System (TMS) is a professional tool for thermoelectric material research. It measures the Seebeck coefficient and electrical resistivity of metals/semiconductors under high-low temperatures, supporting bulk, filamentary, and thin-film samples (thickness ≥50nm).

Variable temperature resistivity measurement system

RMS adopts the four probe method technology and has the ability to detect material resistivity. It can be used to measure the resistivity of semiconductor bulk samples, semi metallic samples (such as constantan, nickel, bismuth, etc.), and some non-metallic samples (such as graphite, carbon materials, etc.).